Electron Microscopy

The Group shares the running of the Interfaculty Electron Microscope Suite, primarily used for research projects in the faculties of Science and Maths, Computing & Technology. 

SEM

The SUPRA ™ 55VP with the improved GEMINI®    FESEM column represents the most versatile ultra high resolution FESEM for semiconductor applications,   material analysis and variable pressure solutions. The SUPRA ™ 55VP combines four instruments in one and provides ultra high resolution over the complete voltage range with the ability to handle large specimens. It is also a fully analytical FESEM with up to 10nA probe current and including variable pressure technology for examining non-conducting specimens without preparation. 

Fully motorised 5-axis stage, and a range of detectors:- 

  • Everhart-Thornley Secondary Electron detector
  • Zeiss Gemini In-Lens Secondary Electron detector
  • Backscattered Electron Detector (KE Developments Centaurus, scintillation-type)
  • VPSE Variable Pressure Secondary Electron Detector
  • Oxford Instruments Aztec Energy Dispersive Spectroscopy (EDS) system with X-Max 50 Silicon Drift Detector (SDD)
  • Aztec HKL Electron Backscattered Diffraction (EBSD) system with HKL Nordlys Nano high-sensitivity camera
  • HKL Fast Acquisition EBSD software

TEM



The JEM-2100 electron microscope provides solutions for a wide range of imaging and analysis in the fields of materials, nanoelectronics, and biological sciences. This TEM produces a high probe current, which allows for improved analytical and diffraction capabilities.
  • Gatan Orius in-line digital camera of 11 megapixels
  • Several Gatan specimen holders for different applications
  • Elemental analysis with the EDAX Genesis 4000 Energy Dispersive X-Ray system.
  • STEM detectors


  • The JEM-2100 has three independent condenser lenses and produces the highest probe current for any given probe size, which allows for improved analytical and diffraction capabilities.

    Fitted with EDAX Genesis XM4 System 60 for TEM, an EDS system for elemental analysis.